Primary considerations for image enhancement in high-pressure scanning electron microscopy : 1. Electron beam scattering and contrast

✍ Scribed by A. N. Farley; J. S. Shah

• Book ID: 119836111
• Publisher: John Wiley and Sons
• Year: 1990
• Tongue: English
• Weight: 528 KB
• Volume: 158
• Category: Article
• ISSN: 0022-2720
• DOI: 10.1111/j.1365-2818.1990.tb03009.x