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Preventing Nanoscale Wear of Atomic Force Microscopy Tips Through the Use of Monolithic Ultrananocrystalline Diamond Probes

✍ Scribed by J. Liu; D. S. Grierson; N. Moldovan; J. Notbohm; S. Li; P. Jaroenapibal; S. D. O'Connor; A. V. Sumant; N. Neelakantan; J. A. Carlisle; K. T. Turner; R. W. Carpick


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
522 KB
Volume
6
Category
Article
ISSN
1613-6810

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