Pressure and electrical resistivity measurements on hot expanded nickel: Comparisons with quantum molecular dynamics simulations and average atom approaches

✍ Scribed by Clérouin, Jean; Starrett, Charles; Faussurier, Gérald; Blancard, Christophe; Noiret, Pierre; Renaudin, Patrick

• Book ID: 119976097
• Publisher: The American Physical Society
• Year: 2010
• Tongue: English
• Weight: 260 KB
• Volume: 82
• Category: Article
• ISSN: 1063-651X
• DOI: 10.1103/PhysRevE.82.046402