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[Presses Polytech. Univ. Romandes ISCAS 2000 Geneva. 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings - Geneva, Switzerland (28-31 May 2000)] 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) - Extraction of Fowler-Nordheim parameters of thin SiO/sub 2/ oxide film including polysilicon gate depletion: validation with an EEPROM memory cell

โœ Scribed by Harabech, N.; Bouchakour, R.; Canet, P.; Pannier, P.; Sorbier, J.P.


Book ID
120579291
Publisher
Presses Polytech. Univ. Romandes
Year
2000
Weight
266 KB
Volume
2
Category
Article
ISBN-13
9780780354821

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