Investigation of vibrational and photolu
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Phan Hong Khoi; Ngo Thi Thanh Tam; Pham Hong Duong; Nguyen Xuan Nghia
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Article
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1999
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John Wiley and Sons
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English
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The Raman spectra of silicon nanocrystals embedded in silicon oxide and in porous silicon were measured at various laser powers. It was found that the Si-Si stretching Raman peak shifts to lower wavenumbers and broadens when the laser power increases. The effect is significant and reversible, i.e. t