The present book is intended to cover the theory and practice of one important branch in modern particle characterization technology โฏ light scattering methods. The topics include several major scattering techniques used in today's particle characterization field. This book is intended mainly for industrial users of light scattering techniques who characterize a variety of particulate systems, and for undergraduate or graduate students studying chemical engineering, material sciences, physical chemistry, or other related fields. To keep the book in a concise format, many theoretical derivations have been omitted, but references where interested readers can find more details are provided. The book is organized in a modular form โฏ each chapter is relatively self-contained. The book's main goal is to introduce both the principles and applications of the various light scattering methods.
The book consists of the following six chapters: Particle characterization โฏ an overview Light scattering โฏ the background information Laser diffraction โฏ sizing from nanometers to millimeters Optical particle counting โฏ counting and sizing Photon correlation spectroscopy โฏ submicron particle characterization Electrophoretic light scattering โฏ zeta potential measurement. Kluwer Academic Publishers (Particle Technology Series, No. 13) Dordrecht/Boston/London May 2000, 432pp. Hardbound, ISBN 0-7923-6300-0, US$172