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Preparation of ZrO2 ultrathin films as gate dielectrics by limited reaction sputtering—On growth delay time at initial growth stage

✍ Scribed by Y. Zhou; N. Kojima; H. Sugiyama; K. Ohara; K. Sasaki


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
470 KB
Volume
254
Category
Article
ISSN
0169-4332

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