Preparation of BiSrCaCuO thin films by atomic layer-by-layer molecular-beam-epitaxy and high-resolution transmission electron microscopy analysis of the film/substrate interface and of growth defects

✍ Scribed by J. Dreßen; N.D. Zakharov; H. Hoffschulz; H. Stahl; D. Hesse; G. Güntherodt

• Book ID: 117623509
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 947 KB
• Volume: 251
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/s0925-8388(96)02785-5