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Preparation by ion milling and TEM investigation of embedded needle-shaped crystals of H-Nb2O5

✍ Scribed by Krumeich, Frank ;Mertin, Wilhelm


Publisher
Wiley (John Wiley & Sons)
Year
1991
Tongue
English
Weight
779 KB
Volume
19
Category
Article
ISSN
0741-0581

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✦ Synopsis


A method for preparing needle-shaped and platelike crystals for electron microscopical investigation was elaborated. Crystals of H-Nb20, were embedded in a synthetic resin and disks were cut off perpendicular to the desired direction of observation. The thickness of the sample was reduced by planar grinding and then by using a dimple grinder and furthermore by ion milling with argon ions. With the precision ion milling system small crystal areas were selected and subsequently irradiated. The TEM investigations showed that the desired crystallographic orientation was reached and that the crystal structure has been preserved. The contrast of highly resolved images was reduced by an amorphous surface layer which was not removable.

Dimple grinder, PIMS, Amorphous surface layer


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