## Abstract __c__‐Axis oriented aluminum nitride (AlN) thin films are successfully prepared on amorphous polyimide films by radiofrequency magnetron reactive sputtering at room temperature. Structural analysis shows that the AlN films have a wurtzite structure and consist of __c__‐axis oriented col
✦ LIBER ✦
Preparation and the properties of PMR-type polyimide composites with aluminum nitride
✍ Scribed by Jiajun Wang; Xiao-Su Yi
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 173 KB
- Volume
- 89
- Category
- Article
- ISSN
- 0021-8995
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