Preparation and analysis of the negative resistance characteristic in an amorphous silicon and silicon–carbide single-barrier device

✍ Scribed by Chen, K. H.; Fang, Y. K.; Shieh, K. H.; Liou, W. R.

• Book ID: 121204704
• Publisher: American Institute of Physics
• Year: 1994
• Tongue: English
• Weight: 456 KB
• Volume: 65
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.112575