Premartensitic time dependent X-ray scattering and stress relaxation in an indium-thallium alloy
✍ Scribed by I.-C. Hwang; T. Suzuki; M. Wuttig
- Publisher
- Elsevier Science
- Year
- 1989
- Weight
- 598 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0001-6160
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✦ Synopsis
Synchronous time dependent X-ray scattering and anelastic stress relaxation experiments were carried out to investigate the dynamic premartensitic properties of an In-24 at.% Tl alloy. The relaxation of the X-ray intensity, 0.2 degrees off the 220 Bragg diffraction peak, has been observed under a uniaxial [OOI] tensile strain of the order of 10m4 as the temperature approaches the marten&tic transformation temperature. The activation energy calculated from the Arrhenius plot of the relaxation times obtained from the X-ray diffraction is 0.78 eV which is equal to the one found previously in the course of an internal friction experiment. However, the activation energy obtained from the anelastic stress relaxation is 0. t 1 eV. It is proposed thaat the high activation energy of 0.78 eV represents the energy of formation of a premartensitic strain embryo. The much smailer activation energy of 0.11 eV is interpreted as the activation energy of stress assisted growth of this embryo.