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Predictive validity of the level of expressed emotion (LEE) scale: Readmission follow-up data for 1, 2, and 5-year periods

✍ Scribed by John D. Cole; Shahe S. Kazarian


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
199 KB
Volume
49
Category
Article
ISSN
0021-9762

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