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Prediction of the degradation of connection characteristics at elevated temperature

✍ Scribed by K.S. Al-Jabri; I.W. Burgess; R.J. Plank

Book ID: 108402182
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 216 KB
Volume: 60
Category: Article
ISSN: 0143-974X
DOI: 10.1016/s0143-974x(03)00142-1

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