Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning–tunneling microscope measurements of interfacial roughness

✍ Scribed by Bruno, William M. ;Roth, James A. ;Burke, Philip E. ;Hewitt, William B. ;Holmbeck, Randal E. ;Neal, Dennis G.

• Book ID: 115343991
• Publisher: The Optical Society
• Year: 1995
• Tongue: English
• Weight: 320 KB
• Volume: 34
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.34.001229