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Prediction of mental status in carriers of the fragile X mutation using CGG repeat length

✍ Scribed by Smits, Arie ;Smeets, Dominique ;Hamel, Ben ;Dreesen, Jos ;de Haan, Anton ;van Oost, Bernard

Publisher: John Wiley and Sons
Year: 1994
Tongue: English
Weight: 381 KB
Volume: 51
Category: Article
ISSN: 0148-7299
DOI: 10.1002/ajmg.1320510440

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