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Prediction of grain size, thickness and absorbance of nanocrystalline tin oxide thin film by Taguchi robust design

โœ Scribed by Saeideh Ebrahimiasl; Wan Md. Zin Wan Yunus; Anuar Kassim; Zulkarnain Zainal


Book ID
113913984
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
692 KB
Volume
12
Category
Article
ISSN
1293-2558

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Tin dioxide thin-film gas sensor prepare
โœ L. Bruno; C. Pijolat; R. Lalauze ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 405 KB

Tin dioxide films are elaborated by a chemical vapour deposition (CVD) method. An accurate control of deposition parameters (temperature, total pressure, duration) so that appropriate annealing conditions (duration, temperature) can be used to modify the structural properties of the films : grain si