✦ LIBER ✦
Predicting oxide failure rates using the matrix of a 64K dram chip : Dennis Wendell, Dennis Segers and Billy Wang. Proc. IEEE Reliab. Phys. Conf. 113 (1984)
- Book ID
- 103276510
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 136 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.