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Precision testing of thin-film resistors : F. E. Mallett, Electron. Compon., March (1969), p. 312

Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 99 KB
Volume: 9
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(70)90260-x

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📂 Article 📅 1969 🏛 Elsevier Science 🌐 English ⚖ 100 KB