Precision measurement technique of integrated MOS capacitor mismatching using a simple on-chip circuit

✍ Scribed by Furukawa, M.; Hatano, H.; Hanihara, K.

• Book ID: 114595608
• Publisher: IEEE
• Year: 1986
• Tongue: English
• Weight: 720 KB
• Volume: 33
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1986.22599