Precision measurement of R=σL/σT and F2 in deep inelastic electron scattering

✍ Scribed by A. Bodek; S. Dasu; R.C. Walker; L.W. Whitlow; J. Alster; R. Arnold; P. de Barbaro; P. Bosted; D. Benton; J. Button-Shafer; G. deChambrier; L. Clogher; B. Debebe; F. Dietrich; B. Filippone; R. Gearhart; H. Harada; R.S. Hicks; J. Jourdan; M.W. Krasny; K. Lang; A. Lung; R. Milner; R. McKeown; A. Para; D. Potterveld; E.M. Riordan; S.E. Rock; Z.M. Szalata; K. Van Bibber

• Book ID: 113391006
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 201 KB
• Volume: 7
• Category: Article
• ISSN: 0920-5632
• DOI: 10.1016/0920-5632(89)90593-8