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Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry

✍ Scribed by L.X. Yang; W. Steinchen; M. Schuth; G. Kupfer

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 878 KB
Volume: 16
Category: Article
ISSN: 0263-2241
DOI: 10.1016/0263-2241(95)00020-0

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