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Precision laser spectroscopy of highly charged ions

✍ Scribed by T. Kühl; S. Borneis; St. Becker; A. Dax; T. Engel; R. Grieser; G. Huber; I. Klaft; O. Klepper; A. Kohl; D. Marx; K. Meier; R. Neumann; F. Schmitt; P. Seelig; L. Völker

Book ID
112722876
Publisher
Springer
Year
1996
Tongue
English
Weight
446 KB
Volume
99
Category
Article
ISSN
0304-3843

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EUV spectroscopy of highly charged xenon
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At the Berlin Electron Beam Ion Trap facility we investigated the radiation of highly charged xenon ions in the extreme ultraviolet wavelength range using a 2 m grazing incidence spectrometer. For Rb-like Xe 17+ to Cu-like Xe 25+ ions 37 individual lines have been registered in the range between 90