Precision fineness of grind measurement—
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Article
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1986
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Elsevier Science
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English
⚖ 93 KB
This capacitor is located just under the device, but not under the conductor I/O to avoid a parasitic capacitive coupling. With the coming of leadless and leaded full array chip carriers such as pin grid array, we applied the same concept with a capacitor inside the cap. The results with different c