✦ LIBER ✦
Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment
✍ Scribed by Cembali, F. ;Fabbri, R. ;Servidori, M. ;Zani, A. ;Basile, G. ;Cavagnero, G. ;Bergamin, A. ;Zosi, G.
- Book ID
- 114500602
- Publisher
- International Union of Crystallography
- Year
- 1992
- Tongue
- English
- Weight
- 863 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0021-8898
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