Precise Thermal Characterization of Confined Nanocrystalline Silicon by a 3ω Method

✍ Scribed by Kihara, Takashi; Harada, Toshihiro; Koshida, Nobuyoshi

• Book ID: 126979617
• Publisher: Institute of Pure and Applied Physics
• Year: 2005
• Tongue: English
• Weight: 204 KB
• Volume: 44
• Category: Article
• ISSN: 0021-4922
• DOI: 10.1143/jjap.44.4084