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Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler

✍ Scribed by Qian, Shinan ;Jark, Werner ;Sostero, Giovanni ;Gambitta, Alessandro ;Mazzolini, Fabio ;Savoia, Adolfo


Book ID
115346061
Publisher
The Optical Society
Year
1997
Tongue
English
Weight
355 KB
Volume
36
Category
Article
ISSN
1559-128X

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