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Precise isotopic measurements of sub-nanogram Nd of standard reference material by thermal ionization mass spectrometry using the NdO+ technique

✍ Scribed by Chao-Feng Li; Fukun Chen; Xiang-Hui Li


Book ID
108146557
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
360 KB
Volume
266
Category
Article
ISSN
1387-3806

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