✦ LIBER ✦
Precise in situ thickness analysis of epitaxial graphene layers on SiC(0001) using low-energy electron diffraction and angle resolved ultraviolet photoelectron spectroscopy
✍ Scribed by Riedl, C.; Zakharov, A. A.; Starke, U.
- Book ID
- 121236099
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 856 KB
- Volume
- 93
- Category
- Article
- ISSN
- 0003-6951
No coin nor oath required. For personal study only.