Precise half-life measurement of the26Si ground state

✍ Scribed by I. Matea; J. Souin; J. Äystö; B. Blank; P. Delahaye; V. -V. Elomaa; T. Eronen; J. Giovinazzo; U. Hager; J. Hakala; J. Huikari; A. Jokinen; A. Kankainen; I. D. Moore; J. -L. Pedroza; S. Rahaman; J. Rissanen; J. Ronkainen; A. Saastamoinen; T. Sonoda; C. Weber

• Book ID: 111619399
• Publisher: Springer
• Year: 2008
• Tongue: English
• Weight: 62 KB
• Volume: 38
• Category: Article
• ISSN: 1434-601X
• DOI: 10.1140/epja/i2008-10678-2