Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials

✍ Scribed by Kraut, E. A.; Grant, R. W.; Waldrop, J. R.; Kowalczyk, S. P.

• Book ID: 126509850
• Publisher: The American Physical Society
• Year: 1980
• Tongue: English
• Weight: 269 KB
• Volume: 44
• Category: Article
• ISSN: 0031-9007
• DOI: 10.1103/PhysRevLett.44.1620