Pre-anthesis high-temperature acclimation alleviates damage to the flag leaf caused by post-anthesis heat stress in wheat

✍ Scribed by Xiao Wang; Jian Cai; Dong Jiang; Fulai Liu; Tingbo Dai; Weixing Cao

• Book ID: 116691013
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 418 KB
• Volume: 168
• Category: Article
• ISSN: 0176-1617
• DOI: 10.1016/j.jplph.2010.09.016