Practical Guide to Materials Characterization: Techniques and Applications

✍ Scribed by Khalid Sultan

• Publisher: Wiley-VCH
• Year: 2022
• Tongue: English
• Leaves: 226
• Category: Library

✦ Synopsis

Practical Guide to Materials Characterization

Practice-oriented resource providing a hands-on overview of the most relevant materials characterization techniques in chemistry, physics, engineering, and more

Practical Guide to Materials Characterization focuses on the most widely used experimental approaches for structural, morphological, and spectroscopic characterization of materials, providing background, insights on the correct usage of the respective techniques, and the interpretation of the results. With a focus on practical applications, the work illustrates what to use and when, including real-life examples showing which characterization techniques are best suited for particular purposes. Furthermore, the work covers the practical elements of the analytical techniques used to characterize a wide range of functional materials (both in bulk as well as thin film form) in a simple but thorough manner.

To aid in reader comprehension, Practical Guide to Materials Characterization is divided into eight distinct chapters. To set the stage, the first chapter of the book reviews the fundamentals of materials characterization that are necessary to understand and use the methods presented in the ensuing chapters. Among the techniques covered are X-ray diffraction, Raman spectroscopy, X-ray spectroscopy, electron microscopies, magnetic measurement techniques, infrared spectroscopy, and dielectric measurements.

Specific sample topics covered in the remaining seven chapters include:

• Bragg’s Law, the Von Laue Treatment, Laue’s Equation, the Rotating Crystal Method, the Powder Method, orientation of single crystals, and structure of polycrystalline aggregates
• Classical theory of Raman scattering, quantum theory of Raman spectroscopy, high-pressure Raman spectroscopy, and surface enhanced Raman spectroscopy
• Basic principles of XAS, energy referencing, XPS spectra and its features, Auger Electron Spectroscopy (AES), and interaction of electrons with matter
• Magnetization measuring instruments, the SQUID magnetometer, and the advantages and disadvantages of vibrating sample magnetometer (VSM)

With comprehensive and in-depth coverage of the subject, Practical Guide to Materials Characterization is a key resource for practicing professionals who wish to better understand key concepts in the field and seamlessly harness them in a myriad of applications across many different industries.

✦ Table of Contents

Practical Guide to Materials Characterization
Contents
List of Figures
List of Tables
Preface
1 Basics of Material Characterization Techniques
1.1 Introduction
1.2 Electromagnetic Spectrum
1.3 Fundamentals of Crystallography
1.4 Molecular Vibrations
1.5 Magnetism in Solids
1.6 Optical Properties of Solids
References
2 X-ray Diffraction
2.1 Introduction
2.2 Bragg’s Law
2.3 Von Laue Treatment: Laue’s Equation
2.4 Experimental Techniques
2.4.1 Laue Method
2.4.2 Rotating Crystal Method
2.4.3 Powder Method
2.5 Geometry and Instrumentation
2.6 Standard XRD Pattern
2.7 Applications
2.7.1 Orientation of Single Crystals
2.7.2 Structure of Polycrystalline Aggregates
2.7.3 XRD in the Pharmaceutical Field and Forensic Science
2.7.4 XRD in the Geological Field
2.8 Examples and Illustrations
2.8.1 XRD Data and Interpretation in the PrFe1–xMnxO3 System
2.8.2 XRD Data and Interpretation in the La1–xCaxMnO3 System
2.8.3 XRD Analysis of EuFe1–xMnxO3 (x = 0.0, 0.3, 0.5)
References
3 Raman Spectroscopy
3.1 Introduction
3.2 Infrared and Raman Spectroscopy
3.3 Raman Spectra: Origin
3.4 Classical Theory of Raman Scattering
3.5 Quantum Theory of Raman Spectroscopy
3.6 Raman Spectrometer
3.6.1 Excitation Source
3.6.2 Sample Illumination
3.6.3 Wavelength Selector
3.6.4 Detection and Control System
3.7 Resonance Raman Spectroscopy
3.8 Special Techniques
3.8.1 High-pressure Raman Spectroscopy
3.8.2 Raman Microscopy
3.8.3 Surface-enhanced Raman Spectroscopy
3.8.4 Raman Spectroelectrochemistry
3.9 Applications and Illustrations
3.9.1 Raman Spectra of the PrFe1–xMnxO3 System at Different Concentrations
of Mn Doped in Place of Fe
3.9.2 Raman Spectra and Measurements of the La1–xCaxMnO3 System (x = 0.0,
0.3, 0.5, and 0.7)
3.9.3 Temperature-dependent Raman Study of La1−xCaxMnO3 (x = 0.0 and
0.3)
References
4 X-ray Spectroscopic Techniques
4.1 X-ray Absorption Spectroscopy
4.1.1 Introduction
4.1.2 Basic Principle of XAS
4.1.3 Experimental Aspects
4.1.3.1 Synchrotron Radiation
4.1.3.2 Experimental Setup
4.1.3.3 Transmission Mode
4.1.3.4 Fluorescence Mode
4.1.3.5 Electron Yield Mode
4.1.4 Examples and Analysis
4.1.4.1 X-ray Absorption Spectra of La1–xCaxMnO3 (x = 0.0, 0.3, 0.5, 0.7) Samples
4.1.4.2 Electronic Structure of PrFe1–xMnxO3 by X-Ray Absorption
Spectroscopy
4.2 X-ray Photoelectron Spectroscopy
4.2.1 Introduction
4.2.2 Basic Principle
4.2.3 Energy Referencing
4.2.4 Instrumentation
4.2.5 XPS Spectra and Their Features
4.3 Auger Electron Spectroscopy
4.3.1 Introduction
4.3.2 Interactions of Electrons with Matter
4.3.3 Competition Between X-ray and Auger Electron Emissions
4.3.4 Auger Process
4.3.5 Kinetic Energy of the Auger Electron
4.3.6 Auger Spectra
4.3.7 Instrumentation
References
5 Magnetic Measurements
5.1 Introduction
5.2 Magnetization Measuring Instruments
5.2.1 Extraction Technique
5.2.2 Vibrating Sample Magnetometer
5.2.3 SQUID Magnetometer
5.3 Advantages and Disadvantage of a Vibrating Sample Magnetometer
5.4 Susceptibility Measurement
5.5 Examples and Illustrations
5.5.1 Magnetic Behavior Shown by Thin Films of the PrFe1–xMnxO3 System Deposited on Substrate Si (100)
5.5.2 Magnetic Behavior of the La1–xCaxMnO3 System Where x is the Concentration of Ca as Dopant and Equals 0.0, 0.3, 0.5, or 0.7
5.5.3 Magnetic Behavior of La1–xCaxMnO3 Thin Films Deposited on Si(100) with x = 0.0, 0.3, 0.5, and 0.7 Being the Concentrations of Ca
References
6 Dielectric Measurements
6.1 Introduction
6.2 Polarization and Dielectric Constant
6.2.1 Electronic or Optical Polarization
6.2.2 Orientational Polarization
6.2.3 Atomic Polarizability
6.2.4 Interfacial Polarization
6.3 Mechanism for the Colossal Dielectric Response
6.4 Frequency Dependence of Polarizability
6.5 Classification of Dielectric Materials
6.5.1 Nonferroelectric Materials
6.5.2 Nonpolar Materials
6.5.3 Polar Materials
6.5.4 Dipolar Materials
6.6 Dielectric Dispersion: A Brief Discussion
6.7 Dielectric Loss and Relaxation
6.8 Complex Permittivity
6.9 Polarization Buildup
6.10 Jonscher’s Universal Law
6.11 Examples and Illustrations
6.11.1 Dielectric Behavior of PrFe1–xMnxO3 with x = 0.0, 0.1, 0.3, and 0.5 Being the Concentration of Mn Doped in a Pristine Compound
6.11.1.1 Frequency and Temperature Dependence of Dielectric Properties
6.11.2 Dielectric Properties of the EuFe1–xMnxO3 System in Which Different Concentrations of Mn Are Doped in EuFeO3
6.11.2.1 Dependence of Dielectric Behavior on Frequency
6.11.2.2 Dependence of Dielectric Behavior on Temperature
References
7 Electron Microscopy
7.1 Introduction
7.2 Generation of an Electron Beam
7.3 Interaction of an Electron Beam with a Sample
7.4 Inelastic Scattering and Absorption
7.5 The Family of Electron Microscopes
7.5.1 The X-ray Microscope
7.5.2 The Transmission Electron Microscope
7.5.3 The Scanning Electron Microscope
7.5.4 The Scanning Transmission Electron Microscope
7.6 Atomic Force Microscopy
7.7 Examples and Illustrations
7.7.1 AFM Studies of PrFe1–xMnxO3 (x = 0.0, 0.1, 0.3, 0.5) Thin Films Grown on Si (100)
7.7.2 Atomic Force Microscopy in the Case of La1–xCaxMnO3 for (a) x = 0.0, (b) x = 0.3, (c) x = 0.5, and (d) x = 0.7
7.7.3 Morphological Studies and Elemental Analysis of EuFe1–xMnxO3 (x = 0.0, 0.3, and 0.5)
References
8 Infrared Spectroscopy
8.1 Introduction
8.2 Instrumentation for FTIR
8.3 Fourier Transform
8.4 Electromagnetic Radiation
8.5 Infrared Absorption
8.6 Normal Modes of Vibration
8.7 Complicating Factors
8.8 Applications of IR Spectroscopy
8.8.1 Food Science
8.8.2 Chemistry in Clinical Practice
8.8.3 Plants
8.8.4 Disease Diagnosis
8.8.5 Environmental Applications
References
Index
EULA