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Power transfer-length method for full biasing contact resistance evaluation of organic field-effect transistors

โœ Scribed by Yong Xu; Takeo Minari; Kazuhito Tsukagoshi; Romain Gwoziecki; Romain Coppard; Francis Balestra; Gerard Ghibaudo


Book ID
113834365
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
964 KB
Volume
12
Category
Article
ISSN
1566-1199

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