<p>Power devices are key to modern power systems, performing essential functions such as inverting and changing voltages, buffering, and switching. The increasing complexity of power systems, with distributed renewable generation on the rise, is posing challenges to these devices. In recent years, s
Power GaN Devices: Materials, Applications and Reliability
โ Scribed by Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni (eds.)
- Publisher
- Springer International Publishing
- Year
- 2017
- Tongue
- English
- Leaves
- 383
- Series
- Power Electronics and Power Systems
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
This book presents the first comprehensive overview of the properties and fabrication methods of GaN-based power transistors, with contributions from the most active research groups in the field. It describes how gallium nitride has emerged as an excellent material for the fabrication of power transistors; thanks to the high energy gap, high breakdown field, and saturation velocity of GaN, these devices can reach breakdown voltages beyond the kV range, and very high switching frequencies, thus being suitable for application in power conversion systems. Based on GaN, switching-mode power converters with efficiency in excess of 99 % have been already demonstrated, thus clearing the way for massive adoption of GaN transistors in the power conversion market. This is expected to have important advantages at both the environmental and economic level, since power conversion losses account for 10 % of global electricity consumption.
The first part of the book describes the properties and advantages of gallium nitride compared to conventional semiconductor materials. The second part of the book describes the techniques used for device fabrication, and the methods for GaN-on-Silicon mass production. Specific attention is paid to the three most advanced device structures: lateral transistors, vertical power devices, and nanowire-based HEMTs. Other relevant topics covered by the book are the strategies for normally-off operation, and the problems related to device reliability. The last chapter reviews the switching characteristics of GaN HEMTs based on a systems level approach.
This book is a unique reference for people working in the materials, device and power electronics fields; it provides interdisciplinary information on material growth, device fabrication, reliability issues and circuit-level switching investigation.
โฆ Table of Contents
Front Matter....Pages i-x
Properties and Advantages of Gallium Nitride....Pages 1-26
Substrates and Materials....Pages 27-52
GaN-on-Silicon CMOS-Compatible Process....Pages 53-68
Lateral GaN Devices for Power Applications (from kHz to GHz)....Pages 69-99
Vertical Gallium Nitride Technology....Pages 101-121
GaN-Based Nanowire Transistors....Pages 123-144
Deep-Level Characterization: Electrical and Optical Methods....Pages 145-163
Modelling of GaN HEMTs: From Device-Level Simulation to Virtual Prototyping....Pages 165-196
Performance-Limiting Traps in GaN-Based HEMTs: From Native Defects to Common Impurities....Pages 197-236
Cascode Gallium Nitride HEMTs on Silicon: Structure, Performance, Manufacturing, and Reliability....Pages 237-254
Gate Injection Transistors: E-mode Operation and Conductivity Modulation....Pages 255-272
Fluorine-Implanted Enhancement-Mode Transistors....Pages 273-293
Drift Effects in GaN High-Voltage Power Transistors....Pages 295-317
Reliability Aspects of 650-V-Rated GaN Power Devices....Pages 319-344
Switching Characteristics of Gallium Nitride Transistors: System-Level Issues....Pages 345-375
Back Matter....Pages 377-380
โฆ Subjects
Power Electronics, Electrical Machines and Networks;Semiconductors;Optical and Electronic Materials;Energy Systems;Electronics and Microelectronics, Instrumentation
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