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Power dependence of gate oxide damage from electron shading effect in high-density-plasma metal etching

✍ Scribed by K Hashimoto; F Shimpuku; A Hasegawa; Y Hikosaka; M Nakamura


Book ID
108389361
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
170 KB
Volume
316
Category
Article
ISSN
0040-6090

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