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Post Si(C)N hillock nucleation and growth in IC copper lines controlled by diffusional creep

✍ Scribed by A. Timma; P. Caubet; B. Chenevier; O. Thomas; B. Kaouache; L. Dumas; P. Normandon; J.C. Giraudin


Book ID
104052436
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
927 KB
Volume
87
Category
Article
ISSN
0167-9317

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