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Post-growth diffusion of be doped ingaas epitaxial layers: experimental and simulated distributions

✍ Scribed by S. Koumetz; J. Marcon; K. Ketata; M. Ketata; F. Lefebvre; P. Martin; P. Launay


Book ID
103955172
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
350 KB
Volume
37
Category
Article
ISSN
0921-5107

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✦ Synopsis


Be diffusion during post-growth annealing has been investigated from InGaAs epitaxial layers grown between InGaAs undoped layers.

A General Substitutional-Interstitial Diffusion mechanism is proposed to explain the observed concentration profiles and related Be diffusion. The concentration dependent diffusivity has also been covered to perform an improved data fitting of Be diffusion profiles.