✦ LIBER ✦
Post-Gate Plasma and Sputter Process Effects on the Radiation Hardness of Metal Gate CMOS Integrated Circuits
✍ Scribed by Anderson, Richard E.
- Book ID
- 114661679
- Publisher
- IEEE
- Year
- 1978
- Tongue
- English
- Weight
- 991 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0018-9499
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