✦ LIBER ✦
Post-breakdown leakage resistance and its dependence on device area
✍ Scribed by Tze Wee Chen; Choshu Ito; William Loh; Robert W. Dutton
- Book ID
- 108210643
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 301 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0026-2714
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