Possible errors in energy dispersive x-ray spectrometry due to Raman scattering
โ Scribed by Van Espen, P. J.; Nullens, H. A.; Adams, F. C.
- Book ID
- 126013233
- Publisher
- American Chemical Society
- Year
- 1979
- Tongue
- English
- Weight
- 412 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0003-2700
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
A fundamental parameters approach that incorporates data on scattered radiation is shown to be a useful tool for the determination of trace elements in light matrices. For thick, transparent samples, a computer program is developed that uses differential intensity equations adjusted for decreasing g
The application of energy-dispersive x-ray fluorescence (EDXRF) spectrometry in the quantitative analysis of samples of Indian nail polishes of apparently similar shades from different manufacturers has been examined by evaluating the possibility of detecting spurious material which is marketed unde