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Possibility of critical field enhancement due to field penetration in high-Tc sponges and thin films

✍ Scribed by Collings, E.W.; Markworth, A.J.; Marken, K.R., Jr.

Book ID: 114550179
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 644 KB
Volume: 25
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.92814

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