Positron Mobility Measurements and Their Relevance to Defect and Impurity Studies in Semiconductors and Insulators

✍ Scribed by Beling, C. D. ;Simpson, R. I. ;Stewart, M. G. ;Wang, Y. Y. ;Fung, S. ;Wai, J. C. H. ;Sun, T. N.

• Publisher: John Wiley and Sons
• Year: 1987
• Tongue: English
• Weight: 700 KB
• Volume: 102
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211020209