Porous surface statistical characterization via fluorescence correlation spectroscopy

✍ Scribed by Plain, J. ;Jaffiol, R. ;Lerondel, G. ;Royer, P.

• Book ID: 105364229
• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 359 KB
• Volume: 204
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200674404

✦ Synopsis

Abstract

The characterization of the porosity or of the pore density is a very important issue for porous materials. We report on a new technique allowing a direct measure of the surface pore density. The number of pores on porous silicon substrates has been measured using fluorescence correlation spectroscopy, a technique that is generally applied in solution to study molecules diffusing through a small observation volume. This technique is used to measure the surface density of luminescent pores in a mesoscopic porous silicon layer. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)