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Porous silicon - rare earth doped xerogel and glass composites

✍ Scribed by Balakrishnan, S. ;Gun'ko, Yurii K. ;Perova, T. S. ;Rafferty, A. ;Astrova, E. V. ;Moore, R. A.

Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
128 KB
Volume
202
Category
Article
ISSN
0031-8965

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✦ Synopsis

Abstract

The development of components for photonics applications is growing exponentially. The sol–gel method is now recognised as a convenient and flexible way to deposit oxide or glass films on a variety of hosts, including porous silicon. In the present work we incorporated erbium and europium doped xerogel into porous silicon and developed new porous silicon – rare earth doped glass composites. Various characteris‐ation techniques including FTIR, Raman Spectroscopy, Thermal Gravimetric Analysis and Scanning Electron Microscopy were employed in this work. (Β© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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## Abstract Porous silicon (PS) is doped with rare earth (RE) ions (Er, Eu, Tb) by electrochemical anodisation. The penetration of RE into the PS layer is confirmed by Rutherford Backscattering Spectroscopy (RBS) and by Energy Dispersive X‐ray (EDX) measurements. Efficient visible and infrared emis