Polytype Stability and Microstructural Characterization of Silicon Carbide Epitaxial Films Grown on [( {hbox{11}}overline{{hbox{2}}} {hbox{0}} )]- and [0001]-Oriented Silicon Carbide Substrates

✍ Scribed by S.M. Bishop; C.L. Reynolds; Z. Liliental-Weber; Y. Uprety; J. Zhu; D. Wang; M. Park; J.C. Molstad; D.E. Barnhardt; A. Shrivastava; T.S. Sudarshan; R.F. Davis

• Book ID: 107453589
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 431 KB
• Volume: 36
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-006-0076-2