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Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite

✍ Scribed by A. Manceau; D. Chateigner; W. P. Gates


Book ID
105983563
Publisher
Springer-Verlag
Year
1998
Tongue
English
Weight
713 KB
Volume
25
Category
Article
ISSN
0342-1791

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