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Polarization effects to enhance surface sensitivity of angle-scanned X-ray photoelectron diffraction in synchrotron-radiation-based experiments

✍ Scribed by Mauro Sambi; Gaetano Granozzi


Book ID
117218706
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
438 KB
Volume
415
Category
Article
ISSN
0039-6028

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