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Polarization-Dependent Total-Reflection Fluorescence X-ray Absorption Fine Structure for 3D Structural Determination and Surface Fine Tuning

✍ Scribed by Takakusagi, Satoru; Chun, Wang-Jae; Uehara, Hiromitsu; Asakura, Kiyotaka; Iwasawa, Yasuhiro

Book ID: 125369821
Publisher: Springer
Year: 2013
Tongue: English
Weight: 735 KB
Volume: 56
Category: Article
ISSN: 1022-5528
DOI: 10.1007/s11244-013-0134-y

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