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Polarization contrast linear spectroscopies for cubic semiconductors under stress: macro- and micro-reflectance difference spectroscopies

✍ Scribed by L.F. Lastras-Martínez; R.E. Balderas-Navarro; R. Castro-García; R. Herrera-Jasso; M. Chavira-Rodríguez; A. Lastras-Martínez


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
374 KB
Volume
523
Category
Article
ISSN
0003-3804

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